Acta Physica Sinica, Volume. 69, Issue 12, 127711-1(2020)

Research progress of the investigation of intrinsic and extrinsic origin of piezoelectric materials by X-ray diffraction

Guan-Jie Zhang, Hao Yang, and Nan Zhang*
Author Affiliations
  • Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering, Xi’an Jiaotong University, Xi’an 710049, China
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    [26] Tagantsev A K, Cross L E, Fousek J[J]. Domains  in Ferroic Crystals and Thin Films, 11-74(2010).

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    Guan-Jie Zhang, Hao Yang, Nan Zhang. Research progress of the investigation of intrinsic and extrinsic origin of piezoelectric materials by X-ray diffraction[J]. Acta Physica Sinica, 2020, 69(12): 127711-1

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    Paper Information

    Received: Feb. 27, 2020

    Accepted: --

    Published Online: Dec. 8, 2020

    The Author Email:

    DOI:10.7498/aps.69.20200301

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