Chinese Journal of Lasers, Volume. 51, Issue 13, 1304003(2024)

Precise Wavelength Measurement of 543‐nm Frequency Stabilized He‑Ne Laser Using Optical Frequency Comb

Qiuye Yu1,2, Jianbo Wang2、*, Cong Yin2, Wenwen Bi2, Lihua Lei3, Baowu Zhang1, and Ming Kong1
Author Affiliations
  • 1College of Metrology & Measurement Engineering, China Jiliang University, Hangzhou 310018, Zhejiang , China
  • 2National Institute of Metrology, Beijing 100029, China
  • 3Shanghai Institute of Measurement and Testing Technology, Shanghai 201203, China
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    Figures & Tables(9)
    Schematics of accurately measuring 543 nm frequency stabilized He-Ne laser wavelength by optical frequency comb. (a) Offset locking unit; (b) SHG 543 nm laser unit; (c) detection and counting unit for beat signals of frequency doubling 543 nm laser and measured thermally stable He-Ne laser
    Experimental setup for measuring 543 nm frequency stabilized He-Ne laser wavelength by optical frequency comb
    Fluctuations of repetition rate and carrier phase shift frequency of optical frequency comb. (a) Repetition rate; (b) carrier phase shift frequency
    Beat note signals of DFB single frequency fiber laser and optical frequency comb before and after filtering
    Frequency fluctuations of 1086 nm DFB single frequency fiber laser before and after loop locking
    Beat note signals of SHG 543 nm laser and thermal frequency stabilized He-Ne laser under test
    Beat note frequency fluctuation of SHG 543 nm laser and thermal frequency stabilized He-Ne laser under test after loop locking
    Frequency stabilities of DFB fiber laser and 543 nm He-Ne laser after loop locking
    Reproducibility of system for accurately measuring 543 nm He-Ne laser wavelength by optical frequency comb
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    Qiuye Yu, Jianbo Wang, Cong Yin, Wenwen Bi, Lihua Lei, Baowu Zhang, Ming Kong. Precise Wavelength Measurement of 543‐nm Frequency Stabilized He‑Ne Laser Using Optical Frequency Comb[J]. Chinese Journal of Lasers, 2024, 51(13): 1304003

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    Paper Information

    Category: Measurement and metrology

    Received: Aug. 8, 2023

    Accepted: Oct. 11, 2023

    Published Online: Jun. 22, 2024

    The Author Email: Jianbo Wang (wangjianbo@nim.ac.cn)

    DOI:10.3788/CJL231097

    CSTR:32183.14.CJL231097

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