Precise Wavelength Measurement of 543‐nm Frequency Stabilized He‑Ne Laser Using Optical Frequency Comb

Qiuye Yu; Jianbo Wang; Cong Yin; Wenwen Bi; Lihua Lei; Baowu Zhang; Ming Kong

doi:10.3788/CJL231097

Chinese Journal of Lasers, Volume. 51, Issue 13, 1304003(2024)

Precise Wavelength Measurement of 543‐nm Frequency Stabilized He‑Ne Laser Using Optical Frequency Comb

Qiuye Yu^1,2, Jianbo Wang^2、*, Cong Yin², Wenwen Bi², Lihua Lei³, Baowu Zhang¹, and Ming Kong¹

Author Affiliations

¹College of Metrology & Measurement Engineering, China Jiliang University, Hangzhou 310018, Zhejiang , China

²National Institute of Metrology, Beijing 100029, China

³Shanghai Institute of Measurement and Testing Technology, Shanghai 201203, China

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Qiuye Yu, Jianbo Wang, Cong Yin, Wenwen Bi, Lihua Lei, Baowu Zhang, Ming Kong. Precise Wavelength Measurement of 543‐nm Frequency Stabilized He‑Ne Laser Using Optical Frequency Comb[J]. Chinese Journal of Lasers, 2024, 51(13): 1304003

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Paper Information

Category: Measurement and metrology

Received: Aug. 8, 2023

Accepted: Oct. 11, 2023

Published Online: Jun. 22, 2024

The Author Email: Jianbo Wang (wangjianbo@nim.ac.cn)

DOI:10.3788/CJL231097

CSTR:32183.14.CJL231097

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology