Acta Optica Sinica, Volume. 37, Issue 8, 0812002-1(2017)

Three-Dimensional Position Measurement Method with Nanoscale Precision for Overlapped Particles in Liquid

Xinyu Chang1, Yanan Zeng2, Hai Lei1, Chengwen Yao1, Junsheng Lu1, and Xiaodong Hu、*
Author Affiliations
  • 1 School of Precision Instrument & Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China;
  • 2 College of Engineering and Technology, Tianjin Agricultural University, Tianjin 300384, China
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    Figures & Tables(7)
    Optical imaging path
    (a) Hologram of single particle; (b) normalized hologram of single particle; (c) focused image after reconstruction of single particle
    Horizontal step displacement measured by (a) Hough transform method and (b) holographic reconstruction focusing method for single particle
    Axial step displacement of single particle
    (a) Hologram of overlapped particles; (b) normalized hologram of overlapped particles; (c) focused image after reconstruction of overlapped particles
    Horizontal step displacement of overlapped particles
    Axial step displacement of overlapped particles
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    Xinyu Chang, Yanan Zeng, Hai Lei, Chengwen Yao, Junsheng Lu, Xiaodong Hu. Three-Dimensional Position Measurement Method with Nanoscale Precision for Overlapped Particles in Liquid[J]. Acta Optica Sinica, 2017, 37(8): 0812002-1

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 13, 2016

    Accepted: --

    Published Online: Sep. 7, 2018

    The Author Email: Hu Xiaodong (xdhu@tju.edu.cn)

    DOI:10.3788/AOS201737.0812002

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