Three-Dimensional Position Measurement Method with Nanoscale Precision for Overlapped Particles in Liquid

Xinyu Chang; Yanan Zeng; Hai Lei; Chengwen Yao; Junsheng Lu; Xiaodong Hu

doi:10.3788/AOS201737.0812002

Acta Optica Sinica, Volume. 37, Issue 8, 0812002-1(2017)

Three-Dimensional Position Measurement Method with Nanoscale Precision for Overlapped Particles in Liquid

Xinyu Chang¹, Yanan Zeng², Hai Lei¹, Chengwen Yao¹, Junsheng Lu¹, and Xiaodong Hu^、*

Author Affiliations

¹ School of Precision Instrument & Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China;

² College of Engineering and Technology, Tianjin Agricultural University, Tianjin 300384, China

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Xinyu Chang, Yanan Zeng, Hai Lei, Chengwen Yao, Junsheng Lu, Xiaodong Hu. Three-Dimensional Position Measurement Method with Nanoscale Precision for Overlapped Particles in Liquid[J]. Acta Optica Sinica, 2017, 37(8): 0812002-1

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Dec. 13, 2016

Accepted: --

Published Online: Sep. 7, 2018

The Author Email: Hu Xiaodong (xdhu@tju.edu.cn)

DOI:10.3788/AOS201737.0812002

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