Acta Optica Sinica, Volume. 38, Issue 9, 0912002(2018)
Focus Control Technology in Immersion Lithography
Fig. 2. Schematic of focus control system architecture of immersion lithography machine
Fig. 3. Focus error distribution and decomposition diagrams. (a) Total error; (b) focal length offset error; (c) y direction tilt error Ry; (d) x direction tilt error Rx; (e) y direction field curvature error Cy; (f) x direction field curvature error Cx; (g) groove type error; (h) undulating type error; (i) linear yaw error; (j) distortion error
Fig. 4. Simulation flow chart of z direction error caused by y direction tilt error Ry
Fig. 5. z-direction error distribution caused by non-normal distribution errors. (a) y direction tilt error Ry;(b) x direction tilt error Rx; (c) y direction field curvature error Cy; (d) x direction field curvature error Cx; (e) distortion error; (f) linear yaw error
Fig. 6. Distribution of the total error of z-direction (focus) errors caused by all sources of error on one exposure field
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Chen Duan, Mingcheng Zong, Wei Fan, Lulu Meng. Focus Control Technology in Immersion Lithography[J]. Acta Optica Sinica, 2018, 38(9): 0912002
Category: Instrumentation, Measurement and Metrology
Received: Feb. 26, 2018
Accepted: Apr. 4, 2018
Published Online: May. 9, 2019
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