Acta Optica Sinica, Volume. 38, Issue 9, 0912002(2018)

Focus Control Technology in Immersion Lithography

Chen Duan1,2,3、*, Mingcheng Zong1,2,3、*, Wei Fan1,2,3, and Lulu Meng1,3
Author Affiliations
  • 1 Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
  • 2 University of Chinese Academy of Sciences, Beijing 100049, China
  • 3 Key Laboratory of Microelectronics Devices & Integrated Technology, Institute of Microelectronics,Chinese Academy of Sciences, Beijing 100029, China;
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    Figures & Tables(9)
    Schematic of defocus error
    Schematic of focus control system architecture of immersion lithography machine
    Focus error distribution and decomposition diagrams. (a) Total error; (b) focal length offset error; (c) y direction tilt error Ry; (d) x direction tilt error Rx; (e) y direction field curvature error Cy; (f) x direction field curvature error Cx; (g) groove type error; (h) undulating type error; (i) linear yaw error; (j) distortion error
    Simulation flow chart of z direction error caused by y direction tilt error Ry
    z-direction error distribution caused by non-normal distribution errors. (a) y direction tilt error Ry;(b) x direction tilt error Rx; (c) y direction field curvature error Cy; (d) x direction field curvature error Cx; (e) distortion error; (f) linear yaw error
    Distribution of the total error of z-direction (focus) errors caused by all sources of error on one exposure field
    Defocus error in 100000 exposure fields
    Probability density of defocus error in 100000 exposure fields
    • Table 1. Total focusing success rate of immersion lithography technology at various IC technology nodes

      View table

      Table 1. Total focusing success rate of immersion lithography technology at various IC technology nodes

      ItemTotal focusing success rate /%
      Single immersionexposure28 nm node(9 immersion exposures)14 nm node(23 immersion exposures)7 nm node(>30 immersion exposures)
      3σ95.968.638.228.5
      4σ>99.7>97.0>93.3>91.4
      Differencebetween thefocusing success rate>3.8>28.4>55.1>62.9
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    Chen Duan, Mingcheng Zong, Wei Fan, Lulu Meng. Focus Control Technology in Immersion Lithography[J]. Acta Optica Sinica, 2018, 38(9): 0912002

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Feb. 26, 2018

    Accepted: Apr. 4, 2018

    Published Online: May. 9, 2019

    The Author Email:

    DOI:10.3788/AOS201838.0912002

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