Optics and Precision Engineering, Volume. 17, Issue 9, 2283(2009)

Inspection of surface mounted IC devices with edge and color features

WU Hui-hui*, ZHANG Xian-min, and HONG Shi-liang
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    WU Hui-hui, ZHANG Xian-min, HONG Shi-liang. Inspection of surface mounted IC devices with edge and color features[J]. Optics and Precision Engineering, 2009, 17(9): 2283

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    Paper Information

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    Received: Jan. 11, 2009

    Accepted: --

    Published Online: Oct. 28, 2009

    The Author Email: WU Hui-hui (wuhuihui215@sohu.com)

    DOI:

    CSTR:32186.14.

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