Chinese Journal of Lasers, Volume. 25, Issue 6, 565(1998)
Deposition and Absolute Reflectivity Measurements of a Mo/Si Multilayer for 13.1 nm Soft X ray at 45° Incidence Angle
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Deposition and Absolute Reflectivity Measurements of a Mo/Si Multilayer for 13.1 nm Soft X ray at 45° Incidence Angle[J]. Chinese Journal of Lasers, 1998, 25(6): 565
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