Chinese Optics, Volume. 17, Issue 3, 640(2024)

Error modeling of polarization devices in simultaneous phase-shifted lateral shearing interferometry

Yu-wen ZHANG, Bing-cai LIU*, Hong-jun WANG, Ai-ling TIAN, Ke-xin REN, and Kai WANG
Author Affiliations
  • Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, Xi’an Technological University, Xi’an 710021, China
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    References(23)

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    [7] SHI T, YANG Y Y, ZHANG L. Surface testing methods of aspheric optical elements[J]. Chinese Optics, 7, 26-46(2014).

    [10] LI P, TANG F, WANG X ZH. Relationship between shear ratio and reconstruction accuracy in lateral shearing interferometry[J]. Optical Engineering, 59, 034113(2020).

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    [14] ZHU Y H, TIAN A L, WANG H J et al. Analysis of the influence of simultaneous phase-shifting shearing interference polarizer[J]. Optical Engineering, 61, 104102(2022).

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    Yu-wen ZHANG, Bing-cai LIU, Hong-jun WANG, Ai-ling TIAN, Ke-xin REN, Kai WANG. Error modeling of polarization devices in simultaneous phase-shifted lateral shearing interferometry[J]. Chinese Optics, 2024, 17(3): 640

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    Paper Information

    Category: Original Article

    Received: Aug. 30, 2023

    Accepted: Nov. 23, 2023

    Published Online: Jul. 31, 2024

    The Author Email:

    DOI:10.37188/CO.2023-0152

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