Laser & Optoelectronics Progress, Volume. 61, Issue 23, 2312004(2024)

Improved Quadratic Normalized for Eliminating Effect of Light Source Fluctuation

Hongbo Gao1, Xiefei Shi1、*, Peng Wang2, Xiaoman Shen1, Jihua Yang1, Limei Zeng1, and Weiguo Zhao3
Author Affiliations
  • 1Institute of Optics, National Institute of Measurement and Testing Technology, Chengdu 610021, Sichuan , China
  • 2Institute of Flow, National Institute of Measurement and Testing Technology, Chengdu 610021, Sichuan , China
  • 3College of Metrology Measurement and Instrument, China Jiliang University, Hangzhou 310000, Zhejiang , China
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    References(14)

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    [4] Fang C Y, Huang X X, Yin D Y. The influence of light source’s fluctuation of xenon lamp integrating sphere on ultraviolet system calibration[J]. Opto-Electronic Engineering, 43, 20-25(2016).

    [7] Zheng C D, Feng G J, Liang F C et al. Establishment on standard device for measuring retroreflection coefficient[J]. Acta Metrologica Sinica, 42, 16-19(2021).

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    [10] Hao Y X, Chen X J, Zhang B Z[M]. Photometry(2010).

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    Hongbo Gao, Xiefei Shi, Peng Wang, Xiaoman Shen, Jihua Yang, Limei Zeng, Weiguo Zhao. Improved Quadratic Normalized for Eliminating Effect of Light Source Fluctuation[J]. Laser & Optoelectronics Progress, 2024, 61(23): 2312004

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jan. 12, 2024

    Accepted: Apr. 3, 2024

    Published Online: Nov. 14, 2024

    The Author Email: Xiefei Shi (21968664@qq.com)

    DOI:10.3788/LOP240507

    CSTR:32186.14.LOP240507

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