Optoelectronic Technology, Volume. 43, Issue 1, 1(2023)

(100) and (111) Selective De⁃substrate Technology after Whole⁃sheet Bonding of Silicon⁃based Metals

Jiayi DU1, Junyang NIE4, Jie SUN1,3, Chang LIN2, Dalei WU2, Tianxi YANG2, Zhonghang HUANG1, and Qun YAN2
Author Affiliations
  • 1National and Local United Engineering Laboratory of Flat Panel Display Technology, Fuzhou University, and Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou 35000, CHN
  • 2Fujian Science and Technology Innovation Laboratory for Optoelectronic Information of China,Fuzhou 350100, CHN
  • 3Quantum Device Physics Laboratory, Chalmers University of Technology, Göteborg41296, Sweden
  • 4Faculty of Electronic and Information Engineering, Xi’an Jiaotong University,Xi’an71009, CHN
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    In this paper, the selective substrate removal technology after the silicon-based metal monolithic bonding was used. The (100) crystalline silicon was bonded to (111) crystalline silicon at high temperature by hot-pressure bonding technology. The (100) crystalline silicon substrate was protected by polydimethylsiloxane (PDMS). Then, the (111) crystalline silicon substrate was roughened to accelerate the etching rate. Finally, the (111) crystalline silicon substrate was removed by the wet selective etching. The (111) crystalline silicon substrate of GaN epitaxial substrates was selectively removed with saving the Si-based driver chip. It is a new technology for the mixing and integration of material. It is expected to be applied in the manufacturing process of self-aligned silicon-based micro-LED microdisplay devices and optoelectronic device integration.

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    Jiayi DU, Junyang NIE, Jie SUN, Chang LIN, Dalei WU, Tianxi YANG, Zhonghang HUANG, Qun YAN. (100) and (111) Selective De⁃substrate Technology after Whole⁃sheet Bonding of Silicon⁃based Metals[J]. Optoelectronic Technology, 2023, 43(1): 1

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    Paper Information

    Category: Research and Trial-manufacture

    Received: Sep. 8, 2022

    Accepted: --

    Published Online: Apr. 14, 2023

    The Author Email:

    DOI:10.19453/j.cnki.1005-488x.2023.01.001

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