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INFRARED, Volume. 44, Issue 12, 24(2023)

Study on the Influence of Test Environment on the Test Results of Sub-mK Infrared Detectors

Jing-fei WANG and Yan-guan CHEN
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    [2] [2] Norton P R. Third-generation Sensors for Night Vision \[J\]. Opto-Electron, 2006, 14(2): 283-296.

    [7] [7] Zhang L S，Feng Y H，Zhao Hao．Application of Pixel-level Digital Integration in Space Infrared Remote Sensing \[C\]. Beijing: International Symposium on Optoelectronic Technology and Application, 2018.

    [8] [8] Kenneth I S，Michael W K，Justin J．Digital-pixel Focal Plane Array Technology \[J\]. Lincoln Laboratory Journal, 2014, 20(2): 36-51.

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    WANG Jing-fei, CHEN Yan-guan. Study on the Influence of Test Environment on the Test Results of Sub-mK Infrared Detectors[J]. INFRARED, 2023, 44(12): 24

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    Received: Jul. 20, 2023

    Accepted: --

    Published Online: Jan. 16, 2024

    The Author Email:

    DOI:10.3969/j.issn.1672-8785.2023.12.004

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology