INFRARED, Volume. 44, Issue 12, 24(2023)

Study on the Influence of Test Environment on the Test Results of Sub-mK Infrared Detectors

Jing-fei WANG and Yan-guan CHEN
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    WANG Jing-fei, CHEN Yan-guan. Study on the Influence of Test Environment on the Test Results of Sub-mK Infrared Detectors[J]. INFRARED, 2023, 44(12): 24

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    Paper Information

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    Received: Jul. 20, 2023

    Accepted: --

    Published Online: Jan. 16, 2024

    The Author Email:

    DOI:10.3969/j.issn.1672-8785.2023.12.004

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