INFRARED, Volume. 44, Issue 12, 24(2023)
Study on the Influence of Test Environment on the Test Results of Sub-mK Infrared Detectors
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WANG Jing-fei, CHEN Yan-guan. Study on the Influence of Test Environment on the Test Results of Sub-mK Infrared Detectors[J]. INFRARED, 2023, 44(12): 24
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Received: Jul. 20, 2023
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Published Online: Jan. 16, 2024
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