INFRARED, Volume. 46, Issue 8, 13(2025)

Analysis of Tunneling Current Characteristics in the THz-STM Based on Simmons Model

Jian-xiong YU1, Yu-lun HE1, Bin HUAN1, Xiang LIU1, and Hai-wei DU1,2、*
Author Affiliations
  • 1School of Instrument Science and Optoelectronic Engineering, Nanchang Hangkong University, Nanchang 330063, China
  • 2Key Laboratory of Nondestructive Testing, Ministry of Education, Nanchang 330063, China
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    YU Jian-xiong, HE Yu-lun, HUAN Bin, LIU Xiang, DU Hai-wei. Analysis of Tunneling Current Characteristics in the THz-STM Based on Simmons Model[J]. INFRARED, 2025, 46(8): 13

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    Paper Information

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    Received: Dec. 24, 2024

    Accepted: Sep. 12, 2025

    Published Online: Sep. 12, 2025

    The Author Email: DU Hai-wei (haiweidu@nchu.edu.cn)

    DOI:10.3969/j.issn.1672-8785.2025.08.003

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