Fig. 1. Schematic of FT Raman measurement. Inset: spatial intensity profile of the 1064 nm pumping light at the confocal point measured by an optical beam profiler

Fig. 2. PL spectra of CdTe/GaAs thin film and GaAs substrate at 77 K. Blue line: zoomed-in of the partial PL spectrum

Fig. 3. FT infrared Raman spectra of CdTe/GaAs thin film and GaAs substrate. Inset: normalized local Raman spectra of LO phonon

Fig. 4. FT infrared Raman spectra of CdTe/GaAs thin film at different excitation power . Inset: evolutions of FWHM(a) and Raman Intensity(b) with excitation power

Fig. 5. Raman spectra of CdTe/GaAs thin film measured by (a)visible Raman spectra at 514 nm; (b) FT infrared Raman spectra at 1064 nm