Laser Journal, Volume. 46, Issue 2, 94(2025)

Semiconductor laser chip defect detection based on improved faster R-CNN

LYU Yifei1, JIA Huayu1、*, and LUO Biao2
Author Affiliations
  • 1College of Electrical and Power Engineering, Taiyuan University of Technology, Taiyuan 030024, China
  • 2Accelink Technologies Co., Lte., Wuhan 430074, China
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    LYU Yifei, JIA Huayu, LUO Biao. Semiconductor laser chip defect detection based on improved faster R-CNN[J]. Laser Journal, 2025, 46(2): 94

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    Paper Information

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    Received: Aug. 21, 2024

    Accepted: Jun. 12, 2025

    Published Online: Jun. 12, 2025

    The Author Email: JIA Huayu (jiahuayu@mail.xjtu.edu.cn)

    DOI:10.14016/j.cnki.jgzz.2025.02.094

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