Laser Journal, Volume. 46, Issue 2, 94(2025)
Semiconductor laser chip defect detection based on improved faster R-CNN
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LYU Yifei, JIA Huayu, LUO Biao. Semiconductor laser chip defect detection based on improved faster R-CNN[J]. Laser Journal, 2025, 46(2): 94
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Received: Aug. 21, 2024
Accepted: Jun. 12, 2025
Published Online: Jun. 12, 2025
The Author Email: JIA Huayu (jiahuayu@mail.xjtu.edu.cn)