Semiconductor laser chip defect detection based on improved faster R-CNN

Laser Journal, Volume. 46, Issue 2, 94(2025)

LYU Yifei¹, JIA Huayu^1、*, and LUO Biao²

Author Affiliations

¹College of Electrical and Power Engineering, Taiyuan University of Technology, Taiyuan 030024, China

²Accelink Technologies Co., Lte., Wuhan 430074, China

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LYU Yifei, JIA Huayu, LUO Biao. Semiconductor laser chip defect detection based on improved faster R-CNN[J]. Laser Journal, 2025, 46(2): 94

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Received: Aug. 21, 2024

Accepted: Jun. 12, 2025

Published Online: Jun. 12, 2025

The Author Email: JIA Huayu (jiahuayu@mail.xjtu.edu.cn)

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