Approach for Measuring Surface Density of Metal Thin Films Based on Full Range Fitting of X-Ray Absorption Spectra

Shuoran Wang; Zhihong Yan; Yichen Sun; Qi Wang; Shouhua Luo

doi:10.3788/LOP230506

Laser & Optoelectronics Progress, Volume. 61, Issue 5, 0512003(2024)

Approach for Measuring Surface Density of Metal Thin Films Based on Full Range Fitting of X-Ray Absorption Spectra

Shuoran Wang¹, Zhihong Yan¹, Yichen Sun¹, Qi Wang^2、**, and Shouhua Luo^1、*

Author Affiliations

¹School of Bioscience and Medical Engineering, Southeast University, Nanjing 210096, Jiangsu, China

²Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, Sichuan, China

show less

Abstract Get PDF(in Chinese)

Cited By

Article index updated: Sep. 8, 2025

The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)

Tools

Get Citation

Copy Citation Text

Shuoran Wang, Zhihong Yan, Yichen Sun, Qi Wang, Shouhua Luo. Approach for Measuring Surface Density of Metal Thin Films Based on Full Range Fitting of X-Ray Absorption Spectra[J]. Laser & Optoelectronics Progress, 2024, 61(5): 0512003

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Jan. 13, 2023

Accepted: Mar. 22, 2023

Published Online: Mar. 12, 2024

The Author Email: Qi Wang (wangqi_caep@163.com), Shouhua Luo (luoshouhua@seu.edu.cn)

DOI:10.3788/LOP230506

CSTR:32186.14.LOP230506

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology