Surface Defect Detection Based on Scattering Field Distribution Fitting Approximation

Xiongxiao Wu; Hongjun Wang; Chen Wei; Ailing Tian; Bingcai Liu; Xueliang Zhu; Weiguo Liu

doi:10.3788/LOP202158.1112003

Laser & Optoelectronics Progress, Volume. 58, Issue 11, 1112003(2021)

Surface Defect Detection Based on Scattering Field Distribution Fitting Approximation

Xiongxiao Wu^*, Hongjun Wang^**, Chen Wei, Ailing Tian, Bingcai Liu, Xueliang Zhu, and Weiguo Liu

Shaanxi Province Key Laboratory of Membrane Technology and Optical Test, School of Optoelectronic Engineering, Xi’an Technological University, Xi’an , Shaanxi 710021, China

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Xiongxiao Wu, Hongjun Wang, Chen Wei, Ailing Tian, Bingcai Liu, Xueliang Zhu, Weiguo Liu. Surface Defect Detection Based on Scattering Field Distribution Fitting Approximation[J]. Laser & Optoelectronics Progress, 2021, 58(11): 1112003

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Sep. 25, 2020

Accepted: Nov. 12, 2020

Published Online: Jun. 7, 2021

The Author Email: Wu Xiongxiao (w18091318348@163.com), Wang Hongjun (whj0253@sina.com)

DOI:10.3788/LOP202158.1112003

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology