Chinese Journal of Lasers, Volume. 47, Issue 4, 409003(2020)

Full-Field Three-Dimensional Test for Scratch Defects Using Digital Holographic Scanning Imaging System

Feng Fang, Tian Ailing*, Liu Bingcai, Feng Danqing, Chen Chen, and Liu Weiguo
Author Affiliations
  • Shaanxi Province Key Laboratory of Membrane Technology and Optical Test, School of Optoelectronic Engineering,Xi''an Technological University, Xi''an, Shaanxi 710021, China
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    Figures & Tables(9)
    Principle diagram of digital holographic microscop
    Scanning path for subaperture image acquisition
    Subaperture stitching principle diagram
    Digital holographic detection device for optical component defects
    Scratch test results. (a) Scratch hologram; (b) spatial spectrum; (c) hologram without measured parts; (d) 2D picture of scratch; (e) cross-section of scratch; (f) 3D figure of scratch
    Subaperture defect holograms. (a) Subaperture 1; (b) subaperture 2; (c) subaperture 3; (d) subaperture 4
    2D distributions of scratch depth in subaperture. (a) Subaperture 1; (b) subaperture 2; (c) subaperture 3; (d) subaperture 4
    2D distribution of scratch depth after splicing
    3D diagram of scratch after splicing
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    Feng Fang, Tian Ailing, Liu Bingcai, Feng Danqing, Chen Chen, Liu Weiguo. Full-Field Three-Dimensional Test for Scratch Defects Using Digital Holographic Scanning Imaging System[J]. Chinese Journal of Lasers, 2020, 47(4): 409003

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    Paper Information

    Category: holography and information processing

    Received: Oct. 18, 2019

    Accepted: --

    Published Online: Apr. 9, 2020

    The Author Email: Ailing Tian (ailintian@xatu.edu.cn)

    DOI:10.3788/CJL202047.0409003

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