Full-Field Three-Dimensional Test for Scratch Defects Using Digital Holographic Scanning Imaging System

Feng Fang; Tian Ailing; Liu Bingcai; Feng Danqing; Chen Chen; Liu Weiguo

doi:10.3788/CJL202047.0409003

Chinese Journal of Lasers, Volume. 47, Issue 4, 409003(2020)

Full-Field Three-Dimensional Test for Scratch Defects Using Digital Holographic Scanning Imaging System

Feng Fang, Tian Ailing^*, Liu Bingcai, Feng Danqing, Chen Chen, and Liu Weiguo

Shaanxi Province Key Laboratory of Membrane Technology and Optical Test, School of Optoelectronic Engineering,Xi''an Technological University, Xi''an, Shaanxi 710021, China

show less

Abstract Get PDF(in Chinese)

Cited By

Article index updated: Mar. 10, 2025

The article is cited by 12 article(s) CLP online library. (Some content might be in Chinese.)

Tools

Get Citation

Copy Citation Text

Feng Fang, Tian Ailing, Liu Bingcai, Feng Danqing, Chen Chen, Liu Weiguo. Full-Field Three-Dimensional Test for Scratch Defects Using Digital Holographic Scanning Imaging System[J]. Chinese Journal of Lasers, 2020, 47(4): 409003

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: holography and information processing

Received: Oct. 18, 2019

Accepted: --

Published Online: Apr. 9, 2020

The Author Email: Ailing Tian (ailintian@xatu.edu.cn)

DOI:10.3788/CJL202047.0409003

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology