INFRARED, Volume. 46, Issue 7, 32(2025)
Study on the Influence of Indium Oxide on Flip-Chip Interconnect Quality and Its Removal Method
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WANG Hui, FENG Xiao-yu, OUYANG Tian, MA Teng-da. Study on the Influence of Indium Oxide on Flip-Chip Interconnect Quality and Its Removal Method[J]. INFRARED, 2025, 46(7): 32
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Received: Oct. 20, 2024
Accepted: Aug. 12, 2025
Published Online: Aug. 12, 2025
The Author Email: WANG Hui (wh19800356080@163.com)