Opto-Electronic Engineering, Volume. 35, Issue 9, 60(2008)

Detection of STN-LCD Defects Based on Image Registration

SHEN Hui-liang*, ZHANG Hong-gang, and LI Zhi-neng
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    References(7)

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    SHEN Hui-liang, ZHANG Hong-gang, LI Zhi-neng. Detection of STN-LCD Defects Based on Image Registration[J]. Opto-Electronic Engineering, 2008, 35(9): 60

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    Paper Information

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    Received: Dec. 22, 2007

    Accepted: --

    Published Online: Mar. 1, 2010

    The Author Email: Hui-liang SHEN (shenhl@zju.edu.cn)

    DOI:

    CSTR:32186.14.

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