Opto-Electronic Engineering, Volume. 35, Issue 9, 60(2008)
Detection of STN-LCD Defects Based on Image Registration
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SHEN Hui-liang, ZHANG Hong-gang, LI Zhi-neng. Detection of STN-LCD Defects Based on Image Registration[J]. Opto-Electronic Engineering, 2008, 35(9): 60
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Received: Dec. 22, 2007
Accepted: --
Published Online: Mar. 1, 2010
The Author Email: Hui-liang SHEN (shenhl@zju.edu.cn)
CSTR:32186.14.
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