Opto-Electronic Engineering, Volume. 35, Issue 9, 60(2008)

Detection of STN-LCD Defects Based on Image Registration

SHEN Hui-liang*, ZHANG Hong-gang, and LI Zhi-neng
Author Affiliations
  • [in Chinese]
  • show less

    a method based on the technique of image registration is proposed for detecting the appearance defects of Super-twisted Nematic Liquid Crystal Display (STN-LCD). The standard template LCD image is first recovered from possible non-uniform illumination, and then the statistical information of each region is collected by image thresholding and region labeling. The template and testing image are registered by control-point detection and affine transform. The defects including stroke-loss and pinhole of the LCD can then be detected by using region statistics such as mean and standard deviation of grayscales. To improve the accuracy of image registration, a special scheme of control-point selection and hybrid image interpolation is proposed. Experimental results show that the proposed method is robust and accurate, and can detect STN-LCD defects automatically. The proposed method is used for industrial applications, and offers advantages over the traditional manual inspection manner.

    Tools

    Get Citation

    Copy Citation Text

    SHEN Hui-liang, ZHANG Hong-gang, LI Zhi-neng. Detection of STN-LCD Defects Based on Image Registration[J]. Opto-Electronic Engineering, 2008, 35(9): 60

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Dec. 22, 2007

    Accepted: --

    Published Online: Mar. 1, 2010

    The Author Email: Hui-liang SHEN (shenhl@zju.edu.cn)

    DOI:

    CSTR:32186.14.

    Topics