Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations

Yunlong Zhu; Julien Vaillant; Guillaume Montay; Manuel François; Yassine Hadjar; Aurélien Bruyant

doi:10.3788/COL201816.071201

Chinese Optics Letters, Volume. 16, Issue 7, 071201(2018)

Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations

Yunlong Zhu^1、*, Julien Vaillant^1,2, Guillaume Montay², Manuel François², Yassine Hadjar¹, and Aurélien Bruyant^1、**

Author Affiliations

¹ICD-L2N, UMR CNRS 6281, Université de Technologie de Troyes, 10004 Troyes, France

²ICD-LASMIS, UMR CNRS 6281, Université de Technologie de Troyes, 10004 Troyes, France

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References(13)

[1] R. Jones, C. Wykes. Holographic and Speckle Interferometry(1989).

[2] K. Creath. Appl. Opt., 24, 3053(1985).

[3] J. Li, S. Li, Y. Sun, H. An. Proc. SPIE, 4183, 309(2001).

[4] A. J. Moore, J. R. Tyrer. Meas. Sci. Technol., 1, 1024(1990).

[5] L. Yang, X. Xie, L. Zhu, S. Wu, Y. Wang. Chin. J. Mech. Eng., 27, 1(2014).

[6] X. Xie, L. Yang, X. Chen, N. Xu, Y. Wang. Proc. SPIE, 8916, 89160D(2013).

[7] L. Yang, A. Ettemeyer. Opt. Eng., 42, 1257(2003).

[8] 3D ESPI System (Q-300).

[9] Y. Zhu, J. Vaillant, M. François, G. Montay, A. Bruyant. Appl. Opt., 56, F97(2017).

[10] O. Sasaki, H. Okazaki. Appl. Opt., 25, 3137(1986).

[11] A. Bruyant, J. Vaillant, T. H. Wu, Y. Zhu, Y. Huang, A. Al Mohtar. Interferometry using generalized lock-in amplifier (G-LIA): a versatile approach for phase-sensitive sensing and imaging. Optical Interferometry(2017).

[12] A. Al Mohtar, J. Vaillant, Z. Sedaghat, M. Kazan, L. Joly, C. Stoeffler, J. Cousin, A. Khoury, A. Bruyant. Opt. Express, 22, 22232(2014).

[13] Products and technologies–deformations.

Cited By

[1] Fangjian Wang, Steffen Krause, Joachim Hug, Christian Rembe. A Contactless Laser Doppler Strain Sensor for Fatigue Testing with Resonance-Testing Machine. Sensors, 21, 319(2021).

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Yunlong Zhu, Julien Vaillant, Guillaume Montay, Manuel François, Yassine Hadjar, Aurélien Bruyant, "Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations," Chin. Opt. Lett. 16, 071201 (2018)

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Paper Information

Category: Instrumentation, measurement, and metrology

Received: Mar. 15, 2018

Accepted: May. 8, 2018

Published Online: Jul. 19, 2018

The Author Email: Yunlong Zhu (yunlong.zhu.2015@utt.fr), Aurélien Bruyant (aurelien.bruyant@utt.fr)

DOI:10.3788/COL201816.071201

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology