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Chinese Optics Letters, Volume. 16, Issue 7, 071201(2018)

Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations

Yunlong Zhu1,*... Julien Vaillant1,2, Guillaume Montay2, Manuel François2, Yassine Hadjar1 and Aurélien Bruyant1,** |Show fewer author(s)
Author Affiliations
  • 1ICD-L2N, UMR CNRS 6281, Université de Technologie de Troyes, 10004 Troyes, France
  • 2ICD-LASMIS, UMR CNRS 6281, Université de Technologie de Troyes, 10004 Troyes, France
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    The article is cited by 7 article(s) from Web of Science.
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    Yunlong Zhu, Julien Vaillant, Guillaume Montay, Manuel François, Yassine Hadjar, Aurélien Bruyant, "Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations," Chin. Opt. Lett. 16, 071201 (2018)

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    Paper Information

    Category: Instrumentation, measurement, and metrology

    Received: Mar. 15, 2018

    Accepted: May. 8, 2018

    Published Online: Jul. 19, 2018

    The Author Email: Yunlong Zhu (yunlong.zhu.2015@utt.fr), Aurélien Bruyant (aurelien.bruyant@utt.fr)

    DOI:10.3788/COL201816.071201

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology