Acta Optica Sinica, Volume. 45, Issue 1, 0112001(2025)

Analysis of Adhesive During Iterative Polishing of Transmission Flat on Vertical Interferometer

Jingjing Li1, Donghui Zheng1、*, Yuqing Liu1, Lei Chen1, Chen Xu2, and Xinyi Yu3
Author Affiliations
  • 1School of Electronic and Optical Engineering, Nanjing University of Science & Technology, Nanjing 210094, Jiangsu , China
  • 2Nanjing Institute of Astronomical Optics & Technology, Chinese Academy of Sciences, Nanjing 210042, Jiangsu , China
  • 3University of Chinese Academy of Sciences (Nanjing), Nanjing 211135, Jiangsu , China
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    Figures & Tables(18)
    Three-dimensional structure of transmission flat supported by 18×3 adhesive spots
    Deformation of adhesive spots. (a) Transmission flat; (b) bubbles; (c) flow tendency
    Grouping of adhesive spots
    Relationships between PV value of error surface and area ratio of single adhesive spot
    Error surface with single adhesive spot completely detaching. (a) Group A; (b) group B; (c) group C
    First nine Zernike coefficients of error surface with single adhesive spot completely detaching
    Relationships between PV value of error surface and deflection angle of single adhesive spot
    Error surface of single adhesive spot with a deflection angle of 8°. (a) Group A; (b) group B; (c) group C
    First nine Zernike coefficients of error surface with single adhesive spot deflecting 8°
    Processing of images for two typical adhesive spots. (a) Adhesive spot 1 with bubbles inside; (b) binarized of adhesive spot 1; (c) adhesive spot 2 with offset center of gravity; (d) binarized of adhesive spot 2
    Simulation result of degumming error surface in 300 mm aperture
    First nine Zernike coefficients of error surface
    Optical path of Φ300 mm vertical Fizeau interferometer
    Iterative polishing of transmission flat. (a) Initial surface; (b) first polishing; (c) second polishing; (d) third polishing; (e) corrected surface; (f) final surface
    Surface parameters during iterative polishing. (a) PV and RMS values; (b) Seidel aberration coefficients
    Relationships between Seidel aberration coefficients and detachment of adhesive spots. (a) Different radius; (b) different deflection angles
    Repeatability experiments for liquid reference tests
    • Table 1. Parameters of related materials for transmission flat

      View table

      Table 1. Parameters of related materials for transmission flat

      MaterialElasticity modulus E /(1010 N·m-2Density ρ /(103 kg·m-3Poisson’s ratio μ
      Fused silica7.272.2010.17
      Silicone rubber2.001.1000.49
      Aluminum7.062.7000.33
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    Jingjing Li, Donghui Zheng, Yuqing Liu, Lei Chen, Chen Xu, Xinyi Yu. Analysis of Adhesive During Iterative Polishing of Transmission Flat on Vertical Interferometer[J]. Acta Optica Sinica, 2025, 45(1): 0112001

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jun. 28, 2024

    Accepted: Aug. 21, 2024

    Published Online: Jan. 20, 2025

    The Author Email: Zheng Donghui (zdonghui@njust.edu.cn)

    DOI:10.3788/AOS241223

    CSTR:32393.14.AOS241223

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