Label-free far-field subdiffraction imaging based on hyperbolic metamaterial

Xuesong Chen; Wenjuan Du; Zhilang Lou; Dongliang Tang

doi:10.12086/oee.2022.220056

Opto-Electronic Engineering, Volume. 49, Issue 11, 220056(2022)

Label-free far-field subdiffraction imaging based on hyperbolic metamaterial

Xuesong Chen¹, Wenjuan Du^1、*, Zhilang Lou¹, and Dongliang Tang²

Author Affiliations

¹School of Physics and Optoelectronics, Xiangtan University, Xiangtan, Hunan 411105, China

²Key Laboratory for Micro/Nano Optoelectronic Devices of Ministry of Education and Hunan Provincial, Key Laboratory of Low-Dimensional Structural Physics and Devices, School of Physics and Electronics, Hunan University, Changsha, Hunan 410082, China

show less

Abstract Get PDF(in Chinese)

References(4)

[6] [6] Liu X W. Label-free far-field super resolution microscopy based on illumination modulation[D]. Hangzhou: Zhejiang University, 2017: 7–11.

[36] [36] Luo X G. Extraordinary Young’s Interferences and Super-Diffraction Laser Lithography[M]//Sugioka K. HandbookofLaserMicro-andNano-Engineering. Cham: Springer, 2020: 1–40.

[48] [48] Born M, Wolf E. PrinciplesofOptics: ElectromagneticTheoryofPropagation, InterferenceandDiffractionofLight[M]. 7th ed. Cambridge: Cambridge University, 1999.

[49] [49] Palik E D. HandbookofOpticalConstantsofSolids. VolumeIII[M]. San Diego: Academic Press, 1998: 356, 760.

Tools

Get Citation

Copy Citation Text

Xuesong Chen, Wenjuan Du, Zhilang Lou, Dongliang Tang. Label-free far-field subdiffraction imaging based on hyperbolic metamaterial[J]. Opto-Electronic Engineering, 2022, 49(11): 220056

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: Article

Received: Apr. 21, 2022

Accepted: --

Published Online: Dec. 27, 2022

The Author Email: Wenjuan Du (wenjuandu@xtu.edu.cn)

DOI:10.12086/oee.2022.220056

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology