Fig. 1. Schematic diagram of frequency shift super-resolution imaging under BPP illumination. (a) Schematic diagram of fourier component detection range under conventional illumination，k_c and k'_c are transverse wave vectors of illuminating and scattered light, respectively, under conventional illumination; (b) Schematic diagram of fourier component detection range under BPP illumination, k_eva and k'_eva are transverse wave vectors of illuminating and scattered light, respectively, under BPP illumination; (c) Extension of the highest detectable fourier component (from red solid line to green solid line), schematic diagram of frequency shift effect; (d) Schematic of BPP illumination

Fig. 2. BPP structure. (a) Schematic of the BPP structure; (b) OTF of Ag/SiO₂ multilayers in TM and TE polarization; (c) OTF for −1、0 and +1 orders; (d) The ratio of OTF for different diffraction orders

Fig. 3. (a)~(c) The OTF of −1, 0, and +1 orders for for different k_inc and k_g, respectively; (d) The OTF of −1, 0, and +1 orders with 170 nm pitch grating at the incident angle of 18 degree

Fig. 4. (a) The optical intensity distributions in the x–z plane when incidence angles are 18°, 46° and 60°, respectively; (b) The corresponding intensity decay curves away from the illumination surface in (a)

Fig. 5. Far-field imaging simulation processes and results for double-slit structure with center-to center distance of 100 nm under BPP illumination with 2.66k₀. (a) The intensity distribution in the x–z plane in FDTD method; (b) Far-field imaging intensity for double-slit structure; (c) Spatial spectrum of double-slit structures; (d) Spatial spectrum of scattered light for double-slit structures in the far field

Fig. 6. (a) The contrast of far-field imaging for double-slit structure with different center-to-center distances illuminated by BPP; (b) The normalized optical intensity for double-slit structure with different center-to-center distances in far-field imaging

Fig. 7. Super-resolution imaging under BPP illumination with transverse wave vector 3.86k₀. (a) OTF of Ag/SiO₂ multilayers in TM polarization; (b) OTF for −1、0 and +1 orders; (c) Far-field imaging intensity for double-slit structure