Chinese Optics Letters, Volume. 18, Issue 5, 051301(2020)
Experimental observation of topologically protected defect states in silicon waveguide arrays
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Tianying Lin, Ze Chen, Xiaopei Zhang, He Li, Xiaoping Liu, Haibin Lü, "Experimental observation of topologically protected defect states in silicon waveguide arrays," Chin. Opt. Lett. 18, 051301 (2020)
Category: Integrated Optics
Received: Dec. 30, 2019
Accepted: Jan. 16, 2020
Posted: Jan. 17, 2020
Published Online: Apr. 28, 2020
The Author Email: Xiaoping Liu (xpliu@nju.edu.cn), Haibin Lü (lvhaibin203@163.com)