Chinese Optics Letters, Volume. 18, Issue 5, 051301(2020)
Experimental observation of topologically protected defect states in silicon waveguide arrays
Fig. 1. (a) Dimer chain with intra-dimer coupling strength
Fig. 3. (a) Eigen spectrum of the two-dimer-chain model illustrated in Fig.
Fig. 4. SEM images of the fabricated SOI waveguide arrays. (a) Two-dimer-chain structure. (b) Uniform array. The input waveguide merges into the center waveguide of the arrays.
Fig. 5. (a), (c) Numerically simulated intensity distributions for light propagation in samples SWG-1 and SWG-2, respectively. (b), (d) Experimentally measured and simulated transmission at the output of samples SWG-1 and SWG-2, respectively.
Fig. 6. (a) Propagation constants of points A, E, and F as functions of the coupling ratio
Fig. 7. Light field evolution for the disordered two-dimer-chain model.
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Tianying Lin, Ze Chen, Xiaopei Zhang, He Li, Xiaoping Liu, Haibin Lü, "Experimental observation of topologically protected defect states in silicon waveguide arrays," Chin. Opt. Lett. 18, 051301 (2020)
Category: Integrated Optics
Received: Dec. 30, 2019
Accepted: Jan. 16, 2020
Posted: Jan. 17, 2020
Published Online: Apr. 28, 2020
The Author Email: Xiaoping Liu (xpliu@nju.edu.cn), Haibin Lü (lvhaibin203@163.com)