Optoelectronic Technology, Volume. 44, Issue 3, 248(2024)
Design and Experiment of Multi-parameter Thin-film Measurement System
[2] He C, He H H, Chang J T et al. Polarisation optics for biomedical and clinical applications: A review[J]. Light-Science & Applications, 10, 322-341(2021).
[4] Li C, Tu H T, Zheng Y X et al. Research on spectroscopic ellipsometry in China with future challenges[J]. Thin Solid Films, 139593, 1-12(2023).
[6] Xuan W C, Ye Z H, Han D L et al. Multiscale simulation of physical vapor deposition[J]. Materials Science and Engineering B-Advanced Functional Solid-State Materials, 295, 116596-116606(2023).
[7] Huang H D, Jiang L, Yao Y Y et al. Controlling film thickness distribution by magnetron sputtering with rotation and revolution[J]. Coatings, 11, 98-110(2021).
[9] Abadias G, Chason E, Keckes J et al. Review article: Stress in thin films and coatings: Current status, challenges, and prospects[J]. Journal of Vacuum Science & Technology A, 36(2018).
[11] Garcia-Caurel E, De Martino A, Gaston J P et al. Application of spectroscopic ellipsometry and Mueller ellipsometry to optical characterization[J]. Applied Spectroscopy, 67, 1-21(2013).
[12] Bordovalos A, Subedi B, Chen L et al. Implications of electron transport layer and back metal contact variations in Tin-lead Perovskite solar cells assessed by spectroscopic ellipsometry and external quantum efficiency[J]. Acs Applied Materials & Interfaces, 15, 19730-19740(2023).
[14] Lotze G, Iyer A H S, Olof Bäcke et al. In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy[J]. Journal of Synchrotron Radiation, 31, 42-54(2024).
[15] Huang Y Q, Suja V C, Yang M H et al. Interfacial stresses on droplet interface bilayers using two photon fluorescence lifetime imaging microscopy[J]. Journal of Colloid and Interface Science, 653, 1196-1204(2024).
[16] Xu L, Pei Y C, Wang D P et al. Analytical solutions for film stress and bending deformation of coated optical lenses[J]. International Journal of Mechanical Sciences, 245, 108111-108122(2023).
[17] Guo J, Fu H Y, Pan B et al. Recent progress of residual stress measurement methods: A review[J]. Chinese Journal of Aeronautics, 34, 54-78(2021).
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Wei SUN, Shangzhong JIN, Yin ZHANG, Zijuan SUN, Sheng XU. Design and Experiment of Multi-parameter Thin-film Measurement System[J]. Optoelectronic Technology, 2024, 44(3): 248
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Received: Jan. 16, 2024
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Published Online: Mar. 5, 2025
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