Detection Method for OLED Pixel Defects Based on Extended Feature Pyramid

Acta Optica Sinica, Volume. 43, Issue 2, 0212005(2023)

Lan Liu¹, Yun Ye^1,2、*, and Tailiang Guo^1,2

Author Affiliations

¹College of Physics and Information Engineering, Fuzhou University, Fuzhou 350100, Fujian, China

²Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou 350100, Fujian, China

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Lan Liu, Yun Ye, Tailiang Guo. Detection Method for OLED Pixel Defects Based on Extended Feature Pyramid[J]. Acta Optica Sinica, 2023, 43(2): 0212005

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Jul. 4, 2022

Accepted: Jul. 25, 2022

Published Online: Feb. 7, 2023

The Author Email: Ye Yun (yeyun07@fzu.edu.cn)

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