Chinese Journal of Lasers, Volume. 46, Issue 9, 910002(2019)

Measurement and Resolution Method for Intra-Pixel Response of Front-Illuminated CMOS Sensors

Hu Zhuoyue1,2, Zhou Xiaodong3, Tang Yujun1, and Chen Fansheng1、*
Author Affiliations
  • 1Key Laboratory of Intelligent Infrared Perception, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Shanghai Academy of Spaceflight Technology, Shanghai 201109, China
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    References(18)

    [3] Ingalls J G, Krick J E, Carey S J et al. Spitzer/IRAC precision photometry: a machine learning approach[J]. Proceedings of SPIE, 10698, 106985E(2018).

    [8] Ketchazo C, Viale T, Boulade O et al. Intrapixel measurement techniques on large focal plane arrays for astronomical applications: a comparative study[J]. Proceedings of SPIE, 10562, 105623D(2017).

    [15] Jain U. Characterization of CMOS image senor[D]. Netherlands: Technische Universiteit Delft(2016).

    [17] Holst G C[M]. Electro-optical imaging system performance, 32-33(2017).

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    Hu Zhuoyue, Zhou Xiaodong, Tang Yujun, Chen Fansheng. Measurement and Resolution Method for Intra-Pixel Response of Front-Illuminated CMOS Sensors[J]. Chinese Journal of Lasers, 2019, 46(9): 910002

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    Paper Information

    Category: remote sensing and sensor

    Received: Mar. 25, 2019

    Accepted: --

    Published Online: Sep. 10, 2019

    The Author Email: Fansheng Chen (cfs@mail.sitp.ac.cn)

    DOI:10.3788/CJL201946.0910002

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