Researching | Sub-Pixel Measurement Accuracy Experiment of Complementary Metal Oxide Semiconductor Imager

Chinese Journal of Lasers, Volume. 34, Issue 1, 118(2007)

Sub-Pixel Measurement Accuracy Experiment of Complementary Metal Oxide Semiconductor Imager

[in Chinese]^1,2、*, [in Chinese]², and [in Chinese]²

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¹[in Chinese]

²[in Chinese]

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References(2)

[1] [1] Carl Christian Liebe, Edwin W. Dennison, Bruce Hancock et al.. Active pixel sensor (APS) based star tracker [C]. IEEE Proc., 1998, 1:119～127

[9] [9] Bart Dierickx, Guy Meynants, Danny Scheffer. Near-100 % fill factor standard CMOS active pixel. http://www.fifactory.com., 2003

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[in Chinese], [in Chinese], [in Chinese]. Sub-Pixel Measurement Accuracy Experiment of Complementary Metal Oxide Semiconductor Imager[J]. Chinese Journal of Lasers, 2007, 34(1): 118

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Paper Information

Category: measurement and metrology

Received: Mar. 1, 2006

Accepted: --

Published Online: Jan. 22, 2007

The Author Email: (liuzhi@cust.edu.cn)

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology