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Chinese Journal of Lasers, Volume. 34, Issue 1, 118(2007)

Sub-Pixel Measurement Accuracy Experiment of Complementary Metal Oxide Semiconductor Imager

[in Chinese]1,2、*, [in Chinese]2, and [in Chinese]2
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  • 2[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. Sub-Pixel Measurement Accuracy Experiment of Complementary Metal Oxide Semiconductor Imager[J]. Chinese Journal of Lasers, 2007, 34(1): 118

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    Paper Information

    Category: measurement and metrology

    Received: Mar. 1, 2006

    Accepted: --

    Published Online: Jan. 22, 2007

    The Author Email: (liuzhi@cust.edu.cn)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology