Chinese Journal of Lasers, Volume. 36, Issue s2, 30(2009)

Effects of Residual Stress on the Performances of Electrostatically Actuated MEMS Micromirrors

Hu Fangrong1,2、*, Yao Jun1, and Chen Jianming3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    References(11)

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    [4] [4] Il Woong Jung,Yves-Alain Peter,Emily Carr et al.. Single-crystal-silicon continuous membrane deformable mirror array for adaptive optics in space-based telescopes[J]. IEEE J. Sel. Top. Quantum Electron.,2007,3(2):162-167

    [5] [5] Y. Fuqian. Membrane modeling of pull-in instability in MEMS sensors and actuators[J]. Proc. IEEE Sensors,2002,2:1199-1203

    [6] [6] Yu Hongbin. Study of the design and fabrication of the MEMS-DMs [D]. Wuhan:Huazhong University of Science and Technology,2005,25-29

    [7] [7] O. Bochobza-Degani,Y. Nemirovsky. Modeling the pull-in parameters of electrostatic actuator with a novel lumped two degrees of pull-in model[J]. Sensor Actuat. A,Phys. 2002,101(3):569-578

    [8] [8] Chang Liu. Foundation of MEMS[M]. Pearson Education Inc.,USA,2006. 108-110

    [9] [9] Jin Qian,Cheng Liu,Dacheng Zhang. Residual stress in micro-electro-mechanical systems[J]. J. Mech. Strength,2001,23(4):393-401

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    [11] [11] Liu Yanzhu,Chen Wenliang,Chen Liqun. Vibration Mechanics [M]. Beijing:High Education Press,1998. 7-8

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    Hu Fangrong, Yao Jun, Chen Jianming. Effects of Residual Stress on the Performances of Electrostatically Actuated MEMS Micromirrors[J]. Chinese Journal of Lasers, 2009, 36(s2): 30

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    Paper Information

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    Received: --

    Accepted: --

    Published Online: Dec. 30, 2009

    The Author Email: Hu Fangrong (hufangrong@sina.com)

    DOI:10.3788/cjl200936s2.0030

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