Optical Technique, Volume. 51, Issue 1, 82(2025)
Measurement of refractive index uniformity of infrared materials based on 3390nm mid-wave infrared interferometer
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[9] [9] Synborski C E, Hanes M J. 10.6 micron wavelength interferometry and the measurement of infrared transmitting materials index of refraction homogeneity［C］∥Practical Electro-Optical Instruments and Techniques. SPIE,1980,255:32—39.
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HUANG Yifei, YUAN Biao, CHEN Miancheng, CHEN Lei. Measurement of refractive index uniformity of infrared materials based on 3390nm mid-wave infrared interferometer[J]. Optical Technique, 2025, 51(1): 82
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