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Optical Technique, Volume. 51, Issue 1, 82(2025)

Measurement of refractive index uniformity of infrared materials based on 3390nm mid-wave infrared interferometer

HUANG Yifei1, YUAN Biao1, CHEN Miancheng2, and CHEN Lei1、*
Author Affiliations
  • 1School of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and Technology, Nanjing 210094, China
  • 2Nanjing Interflight Photoelectric Instrument Co., Ltd., Nanjing 210000, China
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    HUANG Yifei, YUAN Biao, CHEN Miancheng, CHEN Lei. Measurement of refractive index uniformity of infrared materials based on 3390nm mid-wave infrared interferometer[J]. Optical Technique, 2025, 51(1): 82

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    Paper Information

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    Received: Jul. 8, 2024

    Accepted: Feb. 18, 2025

    Published Online: Feb. 18, 2025

    The Author Email: CHEN Lei (chenlei@njust.edu.cn)

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology