Chinese Journal of Lasers, Volume. 46, Issue 5, 0508001(2019)

Applications of Ultrafast Photoemission Electron Microscopy in Nanophotonics

Quan Sun1, Shuai Zu1, Kosei Ueno1, Qihuang Gong3, and Hiroaki Misawa1、**
Author Affiliations
  • 11Research Institute for Electronic Science, Hokkaido University, Sapporo 001-0020, Japan
  • 3Department of Physics, Peking University, Beijing 100871, China
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    Figures & Tables(9)
    Schematics of different PEEM systems. (a) Initial photoemission microscope[7]; (b) PEEM system designed by Engel[8]; (c) principle diagram of PEEM for measurement of surface photoemission in real space; (d) principle diagram of PEEM for measurement of surface photoemission in reciprocal space; (e) principle diagram of PEEM for energy analysis of photoemission electrons[<xref ref-type="bibr" rid
    Schematic of ultrafast PEEM system
    Near-field mapping of gold nanoparticles (Au NPs) by PEEM[6]. (a) SEM image of Au NPs on Nb-doped TiO2 substrate; (b) extinction spectrum of Au NPs; (c) PEEM image of Au NPs upon irradiation by femtosecond laser pulse with central wavelength of around 800 nm; (d) relationship between excitation laser power and integral photoemission intensity
    Near-field imaging. (a) PEEM image of Au nanoblock resonantly excited by fs-laser[16]; (b) PEEM image of Au nanoblock simultaneously irradiated by fs-laser and UV light[16]; (c) PEEM image of dimer resonantly excited by fs-laser[6]; (d) PEEM image of dimer simultaneously irradiated by fs-laser and UV light[6</xref
    Near-field spectral property of Au nanoblocks upon oblique incidence[16]. (a) Photoemission (PE) intensity as a function of excitation wavelength for both p- and s- polarized light with normalization done for each curve; (b) PE intensity as a function of excitation wavelength for both p- and s- polarized light with both curves normalized for peak in curve for p-pol; (c) PEEM images obtained at peak wavelength for quadrupole and inset indicating n
    Near-field spectrum of dolmen structure[19]. (a) Photoemission (PE) intensity as a function of excitationwavelength; (b) UV-PEEM image; (c)-(e) three PEEM images obtained at three characterized wavelengths indicated in (a)
    Optical path for interferometric pump-probe measurement
    Time-resolved PEEM measurements of Au nanoblocks upon oblique incidence. (a) Reflection spectra of two Au nanoblocks for time-resolved PEEM measurement; (b) corresponding evolution of photoemission signal with phase delay[6]; (c) photoemission intensity for dipole mode as a function of delay time between pump and probe pulses; (d) photoemission intensity for quadrupole mode as a function of delay time between pump and probe pulses[<xref ref-t
    Time-resolved PEEM measurements of strong coupling plasmonic nanostructures[22]. (a) Sectional view of sample imaged by scanning transmission electron microscope and inset indicating top view of sample imaged by scanning electron microscope; (b) evolution of dephasing time against detuning between two modes
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    Quan Sun, Shuai Zu, Kosei Ueno, Qihuang Gong, Hiroaki Misawa. Applications of Ultrafast Photoemission Electron Microscopy in Nanophotonics[J]. Chinese Journal of Lasers, 2019, 46(5): 0508001

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    Paper Information

    Category: nonlinear optics

    Received: Dec. 27, 2018

    Accepted: Feb. 18, 2019

    Published Online: Nov. 11, 2019

    The Author Email: Misawa Hiroaki (misawa@es.hokudai.ac.jp)

    DOI:10.3788/CJL201946.0508001

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