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Chinese Journal of Lasers, Volume. 46, Issue 5, 0508001(2019)

Applications of Ultrafast Photoemission Electron Microscopy in Nanophotonics

Quan Sun1, Shuai Zu1, Kosei Ueno1, Qihuang Gong3, and Hiroaki Misawa1、**
Author Affiliations
  • 11Research Institute for Electronic Science, Hokkaido University, Sapporo 001-0020, Japan
  • 3Department of Physics, Peking University, Beijing 100871, China
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    Quan Sun, Shuai Zu, Kosei Ueno, Qihuang Gong, Hiroaki Misawa. Applications of Ultrafast Photoemission Electron Microscopy in Nanophotonics[J]. Chinese Journal of Lasers, 2019, 46(5): 0508001

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    Paper Information

    Category: nonlinear optics

    Received: Dec. 27, 2018

    Accepted: Feb. 18, 2019

    Published Online: Nov. 11, 2019

    The Author Email: Misawa Hiroaki (misawa@es.hokudai.ac.jp)

    DOI:10.3788/CJL201946.0508001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology