Journal of Applied Optics, Volume. 44, Issue 3, 580(2023)

Measurement of normal spectral emissivity of materials at high temperature

Liang YUAN1,2、*, Lin'guang YUAN2, Zaitian DONG2, Yan LI2, Jihong FAN2, Fei LU2, Juncheng ZHAO2, Deng ZHANG2, and Yue YOU2
Author Affiliations
  • 1School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China
  • 2The First Scale Optical Metrology Station of the Science, Technology and Industry for National Defense, Xi'an Institute of Applied Optics, Xi'an 710065, China
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    References(2)

    [15] [15] Department of Electronic Information, General Equipment Department, PLA. Materials coatings - test methods for reflectivity and emissivity - part 2: emissivity GJB5023.2–2003 [S]. Beijing: General Armament Department Military logo Publishing and Distribution Department, 2003.

    [16] [16] National Defense Science,Technology and Industry Level I Metering Station .Calibration specification for infrared material spectral emissivity measurement system: JJF150-2017 [S]. Beijing: State Administration of Science, Technology and Industry for National Defence, 2018.

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    Liang YUAN, Lin'guang YUAN, Zaitian DONG, Yan LI, Jihong FAN, Fei LU, Juncheng ZHAO, Deng ZHANG, Yue YOU. Measurement of normal spectral emissivity of materials at high temperature[J]. Journal of Applied Optics, 2023, 44(3): 580

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    Paper Information

    Category: Research Articles

    Received: May. 16, 2022

    Accepted: --

    Published Online: Jun. 19, 2023

    The Author Email:

    DOI:10.5768/JAO202344.0303002

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