Journal of Applied Optics, Volume. 44, Issue 3, 580(2023)
Measurement of normal spectral emissivity of materials at high temperature
Figures & Tables(6)
Fig. 1. Composition diagram of measurement device of normal emissivity of materials at high temperature
Fig. 2. Physical picture for measurement device of normal emissivity of materials at high temperature
Fig. 4. Measuring results of normal spectral emissivity of SiC sample
Fig. 5. Measuring results of normal spectral emissivity of low emissivity coating
Table 1. Measurement uncertainty analysis of normal spectral emissivity
View tableView in ArticleTable 1. Measurement uncertainty analysis of normal spectral emissivity
不确定度分量 标准不确定度/% 高温黑体发射率 0.05 高温黑体温度测量 0.6 样品材料温度测量 0.6 红外探测系统测量 1.1 光谱分光系统波长测量 0.5 测量重复性 1.0 相对合成标准不确定度 1.8 相对扩展不确定度（k=2） 3.6
Tools
Get Citation
Copy Citation Text
Liang YUAN, Lin'guang YUAN, Zaitian DONG, Yan LI, Jihong FAN, Fei LU, Juncheng ZHAO, Deng ZHANG, Yue YOU. Measurement of normal spectral emissivity of materials at high temperature[J]. Journal of Applied Optics, 2023, 44(3): 580
Paper Information
Category: Research Articles
Received: May. 16, 2022
Accepted: --
Published Online: Jun. 19, 2023
The Author Email:
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20