Journal of Applied Optics, Volume. 46, Issue 2, 372(2025)

Design of ellipsometry parametric stable measurement system based on double-elastic light

Haojie GUO1,2, Rui ZHANG1,2、*, Peng XUE2,3, Chengyu XU1,2, Jianning LYU1,2, and Zhibin WANG2,4
Author Affiliations
  • 1School of Information and Communication Engineering, North University of China, Taiyuan 030051, China
  • 2Engineering and Technology Research Center of Shanxi Provincial for Optical-Electric Information and Instrument, North University of China, Taiyuan 030051, China
  • 3School of Electrical and Control Engineering, North University of China, Taiyuan 030051, China
  • 4School of Instrument and Electronics, North University of China, Taiyuan 030051, China
  • show less
    Figures & Tables(11)
    Schematic diagram of double-elastic ellipsometry measurement system
    Circuit diagram of dual-phase lock-in amplification
    Structure diagram of downsampling
    Structure diagram of first-order CIC filter
    CIC filter designed by Matlab
    FPGA simulation of CIC filter
    FIR filter spectrum generated by Matlab
    FPGA simulation of FIR filter
    Physical image of double-elastic ellipsometry system
    ψ and Δ without sample
    Sample measurement
    Tools

    Get Citation

    Copy Citation Text

    Haojie GUO, Rui ZHANG, Peng XUE, Chengyu XU, Jianning LYU, Zhibin WANG. Design of ellipsometry parametric stable measurement system based on double-elastic light[J]. Journal of Applied Optics, 2025, 46(2): 372

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: May. 23, 2024

    Accepted: --

    Published Online: May. 13, 2025

    The Author Email: Rui ZHANG (张瑞)

    DOI:10.5768/JAO202546.0203002

    Topics