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Microelectronics, Volume. 55, Issue 1, 78(2025)

Simulation Study of Single-event Effects in 22 nm FDSOI Devices

HUNAG Kai, AIERKEN Abuduwayiti, BI Jinshun, LIU Xuefei, WANG Gang, LIU Mingqiang, and WANG Degui
Author Affiliations
  • School of Integrated Circuits, Guizhou Normal University, Guiyang 550025, P R China
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    HUNAG Kai, AIERKEN Abuduwayiti, BI Jinshun, LIU Xuefei, WANG Gang, LIU Mingqiang, WANG Degui. Simulation Study of Single-event Effects in 22 nm FDSOI Devices[J]. Microelectronics, 2025, 55(1): 78

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    Paper Information

    Special Issue:

    Received: Sep. 4, 2024

    Accepted: Jun. 19, 2025

    Published Online: Jun. 19, 2025

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.240304

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology