Laser & Optoelectronics Progress, Volume. 62, Issue 16, 1622003(2025)

Weld Defect Detection Method Based on Improved YOLOv9

Shengjun Xu1,2, Yiheng Hu1,2、*, Erhu Liu1,2, Ya Shi1,2, Xiaohan Li1,2, and Zongfang Ma1,2
Author Affiliations
  • 1College of Information and Control Engineering, Xi’an University of Architecture and Technology, Xi’an 710055, Shaanxi , China
  • 2Key Laboratory of Intelligent Automation Technology for Building Manufacturing, Xi’an 710055, Shaanxi , China
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    Figures & Tables(7)
    DA-YOLO network framework diagram
    Structure diagram of DSAM
    Structure diagram of ADCM
    Images of different defect types from the WELD-DETECT data set. (a) Concave; (b) burr; (c) porosity
    Detection effect visualization of different networks
    • Table 1. Experimental results of the precision comparison between the proposed network and other networks on the WELD-DETECT defect dataset

      View table

      Table 1. Experimental results of the precision comparison between the proposed network and other networks on the WELD-DETECT defect dataset

      MethodParameters /106mAP@0.5 /%Detection speed /(frame /s)AP /%
      BurrConcavePorosity
      Faster R-CNN110.9039.814.942.538.339.8
      MobileNet4.7035.713.657.225.625.3
      EfficientDet6.6041.813.411.590.523.3
      SSD24.0150.216.528.973.847.9
      YOLOv57.0748.818.360.536.250.9
      YOLOv737.2148.216.764.736.345.4
      YOLOv812.1545.215.461.733.342.4
      YOLOv960.8051.220.365.439.748.3
      Proposed62.2156.125.866.545.855.9
    • Table 2. Ablation experiment results

      View table

      Table 2. Ablation experiment results

      ModulemAP@0.5 /%Parameters /106Detection speed /(frame /s)
      Baseline51.260.8020.3
      Baseline+DSAM53.7(+2.5)61.8122.7
      Baseline+ADCM53.1(+1.9)61.1522.4
      Baseline+MPDIoU51.8(+0.6)60.8020.9
      Baseline+DSAM+ADCM55.7(+4.5)62.2124.6
      Baseline+DSAM+ADCM+MPDIoU56.1(+4.9)62.2125.8
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    Shengjun Xu, Yiheng Hu, Erhu Liu, Ya Shi, Xiaohan Li, Zongfang Ma. Weld Defect Detection Method Based on Improved YOLOv9[J]. Laser & Optoelectronics Progress, 2025, 62(16): 1622003

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    Paper Information

    Category: Optical Design and Fabrication

    Received: Jan. 23, 2025

    Accepted: Mar. 5, 2025

    Published Online: Aug. 8, 2025

    The Author Email: Yiheng Hu (1214119126@qq.com)

    DOI:10.3788/LOP250568

    CSTR:32186.14.LOP250568

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