Researching | Large-area 4H-SiC avalanche photodiodes with high gain and low dark current for visible-blind ultraviolet detection

Chinese Optics Letters, Volume. 16, Issue 6, 060401(2018)

Large-area 4H-SiC avalanche photodiodes with high gain and low dark current for visible-blind ultraviolet detection

Xingye Zhou, Jia Li, Weili Lu, Yuangang Wang, Xubo Song, Shunzheng Yin, Xin Tan, Yuanjie Lü^*, Hongyu Guo, Guodong Gu, and Zhihong Feng^**

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National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China

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CLP Journals

[1] Tao Shan, Jianshe Ma, Tianfeng Wu, Zanqiu Shen, Ping Su, "Single scattering turbulence model based on the division of effective scattering volume for ultraviolet communication," Chin. Opt. Lett. 18, 120602 (2020)

[2] Linlin Su, Weizong Xu, Dong Zhou, Fangfang Ren, Dunjun Chen, Rong Zhang, Youdou Zheng, Hai Lu, "Avalanche mechanism analysis of 4H-SiC n-i-p and p-i-n avalanche photodiodes working in Geiger mode," Chin. Opt. Lett. 19, 092501 (2021)

[3] Xingye Zhou, Xin Tan, Yuangang Wang, Xubo Song, Tingting Han, Jia Li, Weili Lu, Guodong Gu, Shixiong Liang, Yuanjie Lü, Zhihong Feng, "High-performance 4H-SiC p-i-n ultraviolet avalanche photodiodes with large active area," Chin. Opt. Lett. 17, 090401 (2019)

Cited By

[1] Xiaolong Cai, Dong Zhou, Liang Cheng, Fangfang Ren, Hong Zhong, Rong Zhang, Youdou Zheng, Hai Lu. Performance improvement of 4H-SiC PIN ultraviolet avalanche photodiodes with different intrinsic layer thicknesses. Chinese Physics B, 28, 098503(2019).

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Xingye Zhou, Jia Li, Weili Lu, Yuangang Wang, Xubo Song, Shunzheng Yin, Xin Tan, Yuanjie Lü, Hongyu Guo, Guodong Gu, Zhihong Feng, "Large-area 4H-SiC avalanche photodiodes with high gain and low dark current for visible-blind ultraviolet detection," Chin. Opt. Lett. 16, 060401 (2018)

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Paper Information

Category: Detectors

Received: Mar. 8, 2018

Accepted: Apr. 16, 2018

Published Online: Jul. 2, 2018

The Author Email: Yuanjie Lü (yuanjielv@163.com), Zhihong Feng (ga917vv@163.com)

DOI:10.3788/COL201816.060401

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology