[1] XUE Hui. Research on some key problems in optical characterization of optical coatings[D](2009).

[2] ZHOU Guanqing, YUAN Dong, LIU Yanguo, et al. Properties of liquid crystal polymer films for electricity-responsive IR reflective windows[J]. Acta Photonica Sinica, 46, 331002(2017).

[3] CHANG C, CHEN W, CHEN Y, et al. Recent progress on two-dimensional materials[J]. Acta Physico Chim Sin, 37, 2108017(2021).

[4] YANG F X, CHENG S S, ZHANG X T, et al. 2D organic materials for optoelectronic applications[J]. Advanced Materials, 30, 1702415(2018).

[5] HILFIKER J N, HONG N, SCHOECHE S. Mueller matrix spectroscopic ellipsometry[J]. Advanced Optical Technologies, 11, 59-91(2022).

[6] ZHANG Y J, LIU M, PENG B, et al. Controlled phase and tunable magnetism in ordered iron oxide nanotube arrays prepared by atomic layer deposition[J]. Scientific Reports, 6, 18401(2016).

[7] BATTIE Y, BROCH L, NACIRI A E, et al. Diameter dependence of the optoelectronic properties of single walled carbon nanotubes determined by ellipsometry[J]. Carbon, 83, 32-39(2015).

[8] DRUDE P. Ueber die gesetze der reflexion und brechung des lichtes an der grenze absorbirender krystalle[J]. Annalen der Physik, 268, 584-625(1887).

[9] DRUDE P[M]. The theory of optics, 7(1959).

[10] HUANG C H, CHEN Y Y, WANG C X, et al. Detection of alpha-fetoprotein through biological signal amplification by biosensor based on imaging ellipsometry[J]. Thin Solid Films, 519, 2763-2767(2011).

[11] NIU Y, JIN G. Protein microarray biosensors based on imaging ellipsometry techniques and their applications[J]. Protein & Cell, 2, 445-455(2011).

[12] LI Weiqi. Development and application of high-precision wide-spectrum Muller matrix ellipsometer[D](2016).

[13] LIU S Y, CHEN X G, ZHANG C W. Development of a broadband Mueller matrix ellipsometer as a powerful tool for nanostructure metrology[J]. Thin Solid Films, 584, 176-185(2015).

[14] ZHAO Zhentang, LIN Tianxia, HUANG Zuohua, et al. The accurate measurement of phase retardation of the wave plate by a null ellipsometer[J]. Laser Journal, 33, 8-9(2012).

[15] ZHOU Yi, WU Guosong, DAI Wei, et al. Accurate determination of optical constants and thickness of absorbing thin films by a combined ellipsometry and spectrophotometry approach[J]. Acta Physica Sinica, 59, 2356-2363(2010).

[16] ZHANG Heng. Research on automatic ellipsometer based on photometry and mixing method[D](2005).

[17] LI Kewu. Research on ellipsometry technology based on fast axis adjustable elastic light modulation[D](2018).

[18] CHEN Youhua, ZHANG Jilong, WANG Yanchao, et al. Single crystal photo-elastic modulator based on lithium niobate piezoelectric and photo-elastic effect[J]. Acta Optica Sinica, 32, 1116002(2012).