Journal of Applied Optics, Volume. 46, Issue 4, 835(2025)

Ellipsometry measurement method based on dual elastic differential frequency modulation

Zhe ZHANG1,2, Kewu LI2, Zhibin WANG1,2、*, and Shuang WANG2
Author Affiliations
  • 1School of Instruments and Electronics, North University of China, Taiyuan 030051, China
  • 2Institute of Frontier Interdisciplinary Sciences, North University of China, Taiyuan 030051, China
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    Figures & Tables(9)
    System schematic diagram of dual elastic differential frequency modulation
    Physical image of dual elastic differential frequency modulation
    Relationship between Bessel series and phase modulation amplitude
    Differential frequency modulation signal
    No sample measurement results
    Physical image of spectral ellipsometer (ESS01)
    Optical carrier signal after loading ellipsometric parameter information
    Sample test results
    • Table 1. Comparison of measurement results

      View table
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      Table 1. Comparison of measurement results

      薄膜厚度 测量值/nm标准 偏差/nm优点
      光谱椭偏仪(ESS01)105.0080.731无需知道样品nk
      双弹光椭偏测量仪105.1670.091测量速度快
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    Zhe ZHANG, Kewu LI, Zhibin WANG, Shuang WANG. Ellipsometry measurement method based on dual elastic differential frequency modulation[J]. Journal of Applied Optics, 2025, 46(4): 835

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    Paper Information

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    Received: Dec. 27, 2023

    Accepted: --

    Published Online: Sep. 16, 2025

    The Author Email: Zhibin WANG (王志斌)

    DOI:10.5768/JAO202546.0403003

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