Journal of Applied Optics, Volume. 46, Issue 4, 835(2025)
Ellipsometry measurement method based on dual elastic differential frequency modulation
Fig. 1. System schematic diagram of dual elastic differential frequency modulation
Fig. 2. Physical image of dual elastic differential frequency modulation
Fig. 3. Relationship between Bessel series and phase modulation amplitude
Fig. 7. Optical carrier signal after loading ellipsometric parameter information
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Zhe ZHANG, Kewu LI, Zhibin WANG, Shuang WANG. Ellipsometry measurement method based on dual elastic differential frequency modulation[J]. Journal of Applied Optics, 2025, 46(4): 835
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Received: Dec. 27, 2023
Accepted: --
Published Online: Sep. 16, 2025
The Author Email: Zhibin WANG (王志斌)